Abstract — Reliability of systems used in space, avionic and biomedical applications is highly critical. Such systems consist of an analog front-end to collect data, an Analog-to-Digital Converter (ADC) to convert the collected data to digital form and a
(ARE)(ARE)SENSITIVITY,
p=3,q=8,r=4
TABLEXI
FLASHADC(NFTVSFT)
0.16
Fig.30.FaultTolerant4-bitFlashADC
0.140.12
"2pC""4pC""6pC""8pC""10pC"
storesacopyofthevalueintheintegrator.Whentheinputisbeingsampled(T1ishighandT2islow),theintegratoroutput(markedbyXinFigure29)shouldnotchange.Intheeventthatafaultcausesittochange,theerrordetectionblock agsanerrorwhichactivatestheredundantblock(whenT2goeshigh).TableXshowstheresultofthesensitivityanalysisrunontheNon-FaultTolerant(NFT)andtheFaultTolerant(FT)versionsofthe -ΣModulator.Theresultsshowa65.8%im-provementinsensitivityand25%improvementinMREwithapproximately75%areaoverhead.C.PatternDetection
InsomeADCs(e.g.,FlashandFI)thesignallinesattheboundarybetweentheanalogandthedigitalblocksexhibitaspeci cpattern.Iftheexpectedpatternisnotdetected,eithera agcanbeassertedor,ifpossible,acorrectioncanbeat-tempted.Thistechniquehasbeenusedforimprovingthereli-abilityofa4-bit ashADC.Theoutputofthecomparatorsinthe ashADCexhibitathermometercodepattern.Therefore,a0detectedwithinastringof1sorvice-versa,indicatesanerror.Thiserrorcanbecorrectedbyselectingthemajorityvaluefromwithinaneighborhoodofxbitsoneithersideofthebittobecorrected,wherex≥1.Forourimplementation,xwastakenas1.Figure30showsthemodi edblockdiagramofthefaulttolerant4-bit ashADC.TheErrorCorrectionblockcontainsthreetypesoferrorcorrectingsubblocks,twofortheboundarysignals(A15andA0)andonefortherestofthesignals.ThefollowingBooleanexpressionsillustratethelogicusedforthecorrection.
A(11)15=A15·(A13+A14)
0=A0+(A1·A2)A
j=Aj·Aj 1+Aj·Aj+1+Aj+1·Aj 1A
(12)(13)
0.1
POF
0.080.060.040.0201
2
3
4
5
6
Sizing Factor
Fig.31.Sensitivityvariationwithsizingandinjectionlevels,q=14,r=4
D.TransistorSizing
Anα-particleinjectionresultsinacurrentspikeatthefaulty
node.Thiscurrenttranslatestoavoltage uctuationwhosemagnitudedependsonthedrivingstrengthofthetransistor,thecapacitanceatthenodeandtheinjectioncurrent[24].Oneoftheprimaryfactorsin uencingthemagnitudeofthe uctuationistheresistanceposedbythetransistorsconnectedtothatnode.Therefore,onewouldexpectanimprovementinthereliabilitybysizingupthetransistorandthusreducingtheresistance.Ontheotherhand,sizingupatransistoralsoincreasesitsfault-sensitivearea.Thebene tsoftransistorsizingwereanalyzedforbothdigitalandanalogcircuitsin[17]andarefurtherdis-cussedinthefollowingsubsections.
1)DigitalCircuits:Thistechniquewasimplementedina2-bitcounter(with73circuitnodes)usedinthedigitaldecima-tion lterinthe -ΣADC,andthevariationofthesensitivitywithsizingandbyboundingthemaximuminjectionlevelwasanalyzed.Figure31showsthatthesensitivityincreasesandthendecreaseswithsizingforboundedinjections.Forinjectionlevelsboundedby1pCanimprovementinreliabilityof33%isobservedwhensizingthecircuitbytwiceitsoriginalsize.Fur-thermore,themaximumvalueofthePOFforahigherinjectionboundoccursatahighersizingratio(1for1pCand2for4pCinFigure31).Fortheabovesimulationsthewholecircuitwassized.Thebene tsofselectivenodesizingonthesensitivityofthe2-bitcounterwerealsostudiedandarediscussednext.Thenodeswhichwillresultinmaximumsensitivitygainsshouldbechosenascandidatesforsizing.Oneoftheschemesthatcanbefollowedsortsthenodesindecreasingorderoftheircontri-butiontotheoverallsensitivityoftheblock.Outofthissortedlistthe rstnnodescanbeselectedascandidatesforresizing.Figure32showsthatforlowerinjectionlevelbounds(1pC)sensitivityimprovementofasmuchas60%isobservedwithanTableXIshowstheresultsofthesensitivityanalysisonthe ashADC.Itwasobservedearlier(SubsectionIII-C.1)thattheanalogportionoftheADCwhichisprimarilycomprisedofcomparatorswasmoresensitive(TableIII)thanthedigitalpart.Sincethistechniqueaddressestheerrorsduetofaultsin-jectedintheanalogblock,itwillprovideconsiderableoverallsensitivityimprovement.Animprovementofaround67.8%insensitivityatthecostof55%areaoverheadwasobserved.